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逻辑 - 专用逻辑热门型号
| 器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
|---|---|---|---|---|---|---|
| IDT74SSTUBF32869ABKG8 | - | 150-TFBGA |
IC BUFFER 14BIT CONF DDR2 150BGA |
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IDT74SSTV16857PAG8 | - | 48-TFSOP（0.240"，6.10mm |
IC BUFFER 14BIT SSTL I/O 48TSSOP |
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IDT74SSTVF16857PAG8 | - | 48-TFSOP（0.240"，6.10mm |
IC BUFFER 14BIT SSTL I/O 48-TSSO |
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| IDT74SSTVF16859NLG8 | - | 56-VFQFN |
IC BUFFER 13-26BIT SSTL 56VFQFPN |
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IDT74SSTVF16859PAG | - | 64-TFSOP |
IC BUFFER 13-26BIT SSTL 64-TSSOP |
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| MAX9967ADCCQ+D | - | * |
IC DCL DUAL 500MBPS ATE 100TQFP |
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SN74ABT18502PMRG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT18640DLG4 | Texas Instruments | 56-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18652PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT8245DWE4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24-SOIC |
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SN74ABT8245DWRG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
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SN74ABT8543DLR | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8543DWE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8543DWG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8543DWRE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8543DWRG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ACT1073NSRG4 | Texas Instruments | 20-SOIC（0.209"，5.30mm |
IC BUS TERMINATION ARRAY 20SOP |
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| MAX19005CCS+ | - | * |
IC DCL QUAD 300MHZ ATE 80TQFP |
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| MAX19005CCS+T | - | * |
IC DCL QUAD 300MHZ ATE 80TQFP |
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| MAX9967ADCCQ+TD | - | * |
IC DCL DUAL 500MBPS ATE 100TQFP |