逻辑 - 专用逻辑_逻辑 - 专用逻辑厂家_型号

逻辑 - 专用逻辑热门型号

型号	制造商	封装	描述
MC10H330FNG	ON Semiconductor	28-LCC（J	IC DRIVER/RCVR QUAD BUS 28-PLCC
MC10H334FNG	ON Semiconductor	20-LCC（J	IC DRIVER/RCVR QUAD BUS 20PLCC
NB100LVEP17DT	ON Semiconductor	20-TSSOP（0.173"，4.40mm	IC DRV/RCV ECL QUAD DIFF 20TSSOP
NB100LVEP17DTR2	ON Semiconductor	20-TSSOP（0.173"，4.40mm	IC DRV/RCV ECL QUAD DIFF 20TSSOP
NB100LVEP17DTR2G	ON Semiconductor	20-TSSOP（0.173"，4.40mm	IC DRV/RCV ECL QUAD DIFF 20TSSOP
NB7VPQ16MMNHTBG	ON Semiconductor	16-VFQFN	IC CML DVR PRE-EMPH 1CH 16-QFN
PI74SSTV16857AE	Pericom	48-TFSOP（0.240"，6.10mm	IC REG BUFFER 14BIT 48TSSOP
PI74SSTVF16857AEX	Pericom	48-TFSOP（0.240"，6.10mm	IC REGIST BUFF 14BIT DDR 48TSSOP
SN7497NE4	Texas Instruments	16-DIP（0.300"，7.62mm）	IC SYNC 6BIT BIN RATE MULT 16DIP
SN74ABT18640DLRG4	Texas Instruments	56-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 18BIT 56SSOP
SN74ABT18646PMG4	Texas Instruments	64-LQFP	IC SCAN TEST DEVICE 18BIT 64LQFP
SN74ABT18652PMG4	Texas Instruments	64-LQFP	IC SCAN TEST DEVICE 18BIT 64LQFP
SN74ABT8245DWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24-SOIC
SN74ABT8245DWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74ABT8543DLR	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8543DLRG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8543DWRG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8646DWRG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8652DLG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8652DLRG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP

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