逻辑 - 专用逻辑_逻辑 - 专用逻辑厂家_型号

逻辑 - 专用逻辑热门型号

型号	制造商	封装	描述
NB7VPQ16MMNHTBG	ON Semiconductor	16-VFQFN	IC CML DVR PRE-EMPH 1CH 16-QFN
NB7VPQ16MMNTXG	ON Semiconductor	16-VFQFN	IC COPPER/CABLE DVR PROG 16-QFN
NB7VQ1006MMNG	ON Semiconductor	24-VFQFN	IC EQUALIZER RECEIVER 24-QFN
PI74SSTVF16857AAE	Pericom	48-TFSOP（0.240"，6.10mm	IC REG BUFFER 14BIT 48TSSOP
PI74SSTVF16859AE	Pericom	64-TFSOP	IC REG BUFFER 13-26BIT 64-TSSOP
SN74ABT18504PMR	Texas Instruments	64-LQFP	IC SCAN TEST DEVICE 20BIT 64LQFP
SN74ABT18652PMG4	Texas Instruments	64-LQFP	IC SCAN TEST DEVICE 18BIT 64LQFP
SN74ABT8245DWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24-SOIC
SN74ABT8543DLR	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8543DWE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8543DWR	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWRE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWRG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8646DLG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8646DWE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8646DWR	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWRE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWRG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC

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