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型号	制造商	封装	描述
SN74BCT8240ANT	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8240ANTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8244ADWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8244ADWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24SOIC
SN74BCT8244ADWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8244ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24SOIC
SN74BCT8244ANTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8245ADW	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE TXRX 24-SOIC
SN74BCT8245ADWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE TXRX 24-SOIC
SN74BCT8245ADWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8245ADWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE TXRX 24-SOIC
SN74BCT8245ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8245ANT	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE TXRX 24-DIP
SN74BCT8245ANTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE TXRX 24-DIP
SN74BCT8373ADWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE LATCH 24SOIC
SN74BCT8373ADWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8373ADWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE LATCH 24SOIC
SN74BCT8373ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8374ADWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE W/FF 24-SOIC
SN74BCT8374ADWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC

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