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型号	制造商	封装	描述
SN74AS181ADWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC ARITHMETIC LOGIC UNIT 24-SOIC
SN74AS181ANT	Texas Instruments	24-DIP（0.300"，7.62mm）	IC ARITHMETIC LOGIC UNIT 24-PDIP
SN74BCT2414DWG4	Texas Instruments	20-SOIC（0.295"，7.50mm	IC MEMORY DECODER 20SOIC
SN74BCT2414DWRG4	Texas Instruments	20-SOIC（0.295"，7.50mm	IC MEMORY DECODER 20SOIC
SN74BCT29854DWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854DWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854DWR	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854DWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854DWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854NT	Texas Instruments	24-DIP（0.300"，7.62mm）	IC TRANSCEIVER 1-9BIT 24DIP
SN74BCT29854NTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC TRANSCEIVER 1-9BIT 24DIP
SN74BCT8240ADWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8240ADWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8240ADWR	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8240ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8240ANT	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8240ANTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8244ADWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8244ADWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24SOIC
SN74BCT8244ADWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24-SOIC

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