逻辑 - 专用逻辑_逻辑 - 专用逻辑厂家_型号

逻辑 - 专用逻辑热门型号

型号	制造商	封装	描述
SN74ABT8543DWR	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWRE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWRG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8646DLG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8646DWE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8646DWR	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWRE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWRG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8652DLR	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8652DWE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8652DWG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8652DWR	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8652DWRE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8652DWRG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8952DLG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TESST DEVICE 28-SSOP
SN74ABT8952DLR	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TESST DEVICE 28-SSOP
SN74ABT8952DLRG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TESST DEVICE 28-SSOP
SN74ABT8952DWE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TESST DEVICE 28-SOIC
SN74ABT8952DWG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC

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