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逻辑 - 专用逻辑热门型号
| 器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
|---|---|---|---|---|---|---|
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SN74ABT8646DWRG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8652DLG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8652DLR | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8652DLRG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8652DWE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8652DWR | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8652DWRE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8652DWRG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8952DLG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TESST DEVICE 28-SSOP |
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SN74ABT8952DLR | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TESST DEVICE 28-SSOP |
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SN74ABT8952DLRG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TESST DEVICE 28-SSOP |
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SN74ABT8952DWE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TESST DEVICE 28-SOIC |
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SN74ABT8952DWG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8952DWRG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABTE16245DLG4 | Texas Instruments | 48-BSSOP（0.295"，7.50mm |
IC 16BIT I-WS BUS TXRX 48-SSOP |
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SN74ABTE16246DLG4 | Texas Instruments | 48-BSSOP（0.295"，7.50mm |
IC 11BIT I-WS BUS TXRX 48-SSOP |
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SN74ABTE16246DLRG4 | Texas Instruments | 48-BSSOP（0.295"，7.50mm |
IC 11BIT I-WS BUS TXRX 48-SSOP |
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SN74ABTH16460DLG4 | Texas Instruments | 56-BSSOP（0.295"，7.50mm |
IC REGISTERED TRANSCVR 56SSOP |
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SY100EL16VAKG | - | 8-TSSOP，8-MSOP（0.118"，3.00mm |
IC RCVR DIFF 3.3/5V 8-MSOP |
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SY100EL16VBZG | - | 8-SOIC（0.154"，3.90mm |
IC RCVR DIFF 3.3/5V 8-SOIC |