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逻辑 - 专用逻辑热门型号

型号	制造商	封装	描述
MC10EP17DWR2	ON Semiconductor	20-SOIC（0.295"，7.50mm	IC RCVR/DRVR QUAD ECL DFF 20SOIC
MC10EP17MNG	ON Semiconductor	20-VFQFN	IC RCVR/DRVR QUAD DIFF ECL 20QFN
MC10EP17MNTXG	ON Semiconductor	20-VFQFN	IC RCVR/DRVR QUAD DIFF ECL 20QFN
MC10H180P	ON Semiconductor	16-DIP（0.300"，7.62mm）	IC ADDER/SUBTR DUAL 2BIT 16-DIP
MC10H180PG	ON Semiconductor	16-DIP（0.300"，7.62mm）	IC ADDER/SUBTR DUAL 2BIT 16-DIP
MC10H330P	ON Semiconductor	24-DIP（0.300"，7.62mm）	IC DRIVER/RCVR QUAD BUS 24-DIP
MC10LVEP16DG	ON Semiconductor	8-SOIC（0.154"，3.90mm	IC RECEIVER/DRVR ECL DIFF 8SOIC
NB100LVEP17MN	ON Semiconductor	24-VFQFN	IC DRVR ECL QUAD 2.5V/3.3V 24QFN
NB100LVEP17MNR2	ON Semiconductor	24-VFQFN	IC DRVR ECL QUAD 2.5V/3.3V 24QFN
SN74ABT8543DLR	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8543DWE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8543DWR	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWRE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8543DWRG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8646DLG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8646DLRG4	Texas Instruments	28-BSSOP（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SSOP
SN74ABT8646DWG4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28SOIC
SN74ABT8646DWR	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ABT8646DWRE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC

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