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逻辑 - 专用逻辑热门型号
| 器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
|---|---|---|---|---|---|---|
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PI74SSTVF16857AE | Pericom | 48-TFSOP（0.240"，6.10mm |
IC REG BUFFER 14BIT 48TSSOP |
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PI74SSTVF16857AEX | Pericom | 48-TFSOP（0.240"，6.10mm |
IC REGIST BUFF 14BIT DDR 48TSSOP |
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SN7497NE4 | Texas Instruments | 16-DIP（0.300"，7.62mm） |
IC SYNC 6BIT BIN RATE MULT 16DIP |
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SN74ABT18245ADLG4 | Texas Instruments | 56-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18245ADLRG4 | Texas Instruments | 56-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18502PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT18502PMRG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT18504PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18504PMR | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18504PMRG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18640DLG4 | Texas Instruments | 56-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT8245DWRE4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24-SOIC |
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SN74ABT8245DWRG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
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SN74ABT8543DLG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8543DLRG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8543DWR | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8543DWRG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8646DLG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8646DLRG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8646DWE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |