逻辑 - 专用逻辑热门型号
器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
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PI74SSTU32866NBE | Pericom | 96-LFBGA |
IC 25BIT CONFIG REG BUFF 96LFBGA |
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PI74SSTV16857AE | Pericom | 48-TFSOP(0.240",6.10mm |
IC REG BUFFER 14BIT 48TSSOP |
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PI74SSTV16857AEX | Pericom | 48-TFSOP(0.240",6.10mm |
IC REGIST BUFF 14BIT DDR 48TSSOP |
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PI74SSTVF16857AAE | Pericom | 48-TFSOP(0.240",6.10mm |
IC REG BUFFER 14BIT 48TSSOP |
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PI74SSTVF16857AE | Pericom | 48-TFSOP(0.240",6.10mm |
IC REG BUFFER 14BIT 48TSSOP |
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PI74SSTVF16857AEX | Pericom | 48-TFSOP(0.240",6.10mm |
IC REGIST BUFF 14BIT DDR 48TSSOP |
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SN7497NE4 | Texas Instruments | 16-DIP(0.300",7.62mm) |
IC SYNC 6BIT BIN RATE MULT 16DIP |
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SN74ABT18245ADLG4 | Texas Instruments | 56-BSSOP(0.295",7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18245ADLRG4 | Texas Instruments | 56-BSSOP(0.295",7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18502PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT18502PMRG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT18504PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18504PMR | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18504PMRG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18640DLG4 | Texas Instruments | 56-BSSOP(0.295",7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18640DLRG4 | Texas Instruments | 56-BSSOP(0.295",7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18646PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT18652PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT8245DWE4 | Texas Instruments | 24-SOIC(0.295",7.50mm |
IC SCAN TEST DEVICE 24-SOIC |
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SY100EL16VBZG | - | 8-SOIC(0.154",3.90mm |
IC RCVR DIFF 3.3/5V 8-SOIC |