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逻辑 - 专用逻辑热门型号
| 器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
|---|---|---|---|---|---|---|
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MC10H330FNR2G | ON Semiconductor | 28-LCC（J |
IC DRIVER/RCVR QUAD BUS 28-PLCC |
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| NB4N527SMNR2 | ON Semiconductor | 16-VFQFN |
IC DRVR/RCVR/BUFF/XLATOR 16-QFN |
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| NB7L216MN | ON Semiconductor | 16-VFQFN |
IC RECEIVER/DRIVER DIFF 16-QFN |
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| NB7L216MNR2 | ON Semiconductor | 16-VFQFN |
IC RECEIVER/DRIVER DIFF 16-QFN |
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NB7L216MNR2G | ON Semiconductor | 16-VFQFN |
IC RECEIVER/DRIVER DIFF 16-QFN |
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NB7VPQ16MMNHTBG | ON Semiconductor | 16-VFQFN |
IC CML DVR PRE-EMPH 1CH 16-QFN |
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NB7VPQ16MMNTXG | ON Semiconductor | 16-VFQFN |
IC COPPER/CABLE DVR PROG 16-QFN |
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| PI74SSTU32866NBE | Pericom | 96-LFBGA |
IC 25BIT CONFIG REG BUFF 96LFBGA |
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PI74SSTV16857AEX | Pericom | 48-TFSOP（0.240"，6.10mm |
IC REGIST BUFF 14BIT DDR 48TSSOP |
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PI74SSTVF16857AAE | Pericom | 48-TFSOP（0.240"，6.10mm |
IC REG BUFFER 14BIT 48TSSOP |
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PI74SSTVF16857AEX | Pericom | 48-TFSOP（0.240"，6.10mm |
IC REGIST BUFF 14BIT DDR 48TSSOP |
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SN7497NE4 | Texas Instruments | 16-DIP（0.300"，7.62mm） |
IC SYNC 6BIT BIN RATE MULT 16DIP |
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SN74ABT18245ADLG4 | Texas Instruments | 56-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18502PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT18502PMRG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 18BIT 64LQFP |
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SN74ABT18504PMG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18504PMR | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18504PMRG4 | Texas Instruments | 64-LQFP |
IC SCAN TEST DEVICE 20BIT 64LQFP |
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SN74ABT18640DLG4 | Texas Instruments | 56-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |
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SN74ABT18640DLRG4 | Texas Instruments | 56-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 18BIT 56SSOP |