- 封装:28-BSSOP(0.295",7.50mm 宽)
- RoHS:无铅 / 符合限制有害物质指令(RoHS)规范要求
- 包装方式:管件
- 参考价格:$10.795-$9.84252
更新日期:2024-04-01 00:04:00
产品简介:具有八路寄存总线收发器的扫描测试设备
查看详情- 封装:28-BSSOP(0.295",7.50mm 宽)
- RoHS:无铅 / 符合限制有害物质指令(RoHS)规范要求
- 包装方式:管件
- 参考价格:$10.795-$9.84252
SN74ABT8543DL 供应商
- 公司
- 型号
- 品牌
- 封装/批号
- 数量
- 地区
- 日期
- 说明
- 询价
-
TI
-
原厂原装
22+ -
3288
-
上海市
-
-
-
一级代理原装
-
TI(德州仪器)
-
SSOP-28
2022+ -
12000
-
上海市
-
-
-
原装可开发票
SN74ABT8543DL 中文资料属性参数
- 标准包装:40
- 类别:集成电路 (IC)
- 家庭:逻辑 - 专用逻辑
- 系列:74ABT
- 逻辑类型:扫描测试设备,带寄存总线收发器
- 电源电压:4.5 V ~ 5.5 V
- 位数:8
- 工作温度:-40°C ~ 85°C
- 安装类型:表面贴装
- 封装/外壳:28-BSSOP(0.295",7.50mm 宽)
- 供应商设备封装:28-SSOP
- 包装:管件
- 其它名称:296-4107-5
产品特性
- Members of the Texas Instruments SCOPETM Family of Testability Products
- Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- Functionally Equivalent to 'F543 and 'ABT543 in the Normal-Function Mode
- SCOPETM Instruction Set IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ Parallel-Signature Analysis at Inputs With Masking Option Pseudo-Random Pattern Generation From Outputs Sample Inputs/Toggle Outputs Binary Count From Outputs Even-Parity Opcodes
- IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
- Parallel-Signature Analysis at Inputs With Masking Option
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Even-Parity Opcodes
- Two Boundary-Scan Cells Per I/O for Greater Flexibility
- State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
- Package Options Include Plastic Small-Outline (DW) and Shrink Small-Outline (DL) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT)
产品概述
The 'ABT8543 scan test devices with octal registered bus
transceivers are members of the Texas Instruments SCOPETM
testability integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan access to the test
circuitry is accomplished via the 4-wire test access port (TAP)
interface.In the normal mode, these devices are functionally equivalent to
the 'F543 and 'ABT543 octal registered bus transceivers. The test
circuitry can be activated by the TAP to take snapshot samples of the
data appearing at the device pins or to perform a self-test on the
boundary-test cells. Activating the TAP in normal mode does not
affect the functional operation of the SCOPETM octal
registered bus transceivers. Data flow in each direction is controlled by latch-enable ( and ), chip-enable ( and ), and output-enable ( and ) inputs. For A-to-B data flow, the
device operates in the transparent mode when and are both low. When either or is high, the A data is latched.
The B outputs are active when and are both low.
When either or is high, the B outputs are in the
high-impedance state. Control for B-to-A data flow is similar to that
for A-to-B, but uses ,
, and .In the test mode, the normal operation of the SCOPETM
registered bus transceiver is inhibited and the test circuitry is
enabled to observe and control the I/O boundary of the device. When
enabled, the test circuitry performs boundary-scan test operations as
described in IEEE Standard 1149.1-1990.Four dedicated test pins control the operation of the test
circuitry: test data input (TDI), test data output (TDO), test mode
select (TMS), and test clock (TCK). Additionally, the test circuitry
performs other testing functions such as parallel-signature analysis
(PSA) on data inputs and pseudo-random pattern generation (PRPG) from
data outputs. All testing and scan operations are synchronized to the
TAP interface.The SN54ABT8543 is characterized for operation over the full
military temperature range of -55°C to 125°C. The
SN74ABT8543 is characterized for operation from -40°C to
85°C.
SN74ABT8543DL 数据手册
数据手册 | 说明 | 数量 | 操作 |
---|---|---|---|
![]() |
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
25 Pages页,358K | 查看 |
![]() |
Scan Test Device with Registered Bus Transceiver IC 28-SSOP |
31页,533K | 查看 |
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