- 封装:56-BSSOP(0.295",7.50mm 宽)
- RoHS:无铅 / 符合限制有害物质指令(RoHS)规范要求
- 包装方式:管件
- 参考价格:$10.37-$9.455
更新日期:2024-04-01 00:04:00
产品简介:具有 18 位反向总线收发器的扫描测试设备
查看详情- 封装:56-BSSOP(0.295",7.50mm 宽)
- RoHS:无铅 / 符合限制有害物质指令(RoHS)规范要求
- 包装方式:管件
- 参考价格:$10.37-$9.455
SN74ABT18640DL 供应商
- 公司
- 型号
- 品牌
- 封装/批号
- 数量
- 地区
- 日期
- 说明
- 询价
-
TI
-
原厂原装
22+ -
3288
-
上海市
-
-
-
一级代理原装
-
TI
-
-
2019+ -
5800
-
上海市
-
-
-
全新原装现货
SN74ABT18640DL 中文资料属性参数
- 标准包装:20
- 类别:集成电路 (IC)
- 家庭:逻辑 - 专用逻辑
- 系列:74ABT
- 逻辑类型:扫描测试设备,带反相总线收发器
- 电源电压:4.5 V ~ 5.5 V
- 位数:18
- 工作温度:-40°C ~ 85°C
- 安装类型:表面贴装
- 封装/外壳:56-BSSOP(0.295",7.50mm 宽)
- 供应商设备封装:56-SSOP
- 包装:管件
- 其它名称:296-3942-5
产品特性
- Members of the Texas Instruments SCOPETM Family of Testability Products
- Members of the Texas Instruments WidebusTM Family
- Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
- SCOPETM Instruction Set IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ Parallel-Signature Analysis at Inputs Pseudo-Random Pattern Generation From Outputs Sample Inputs/Toggle Outputs Binary Count From Outputs Device Identification Even-Parity Opcodes
- IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
- Parallel-Signature Analysis at Inputs
- Pseudo-Random Pattern Generation From Outputs
- Sample Inputs/Toggle Outputs
- Binary Count From Outputs
- Device Identification
- Even-Parity Opcodes
- State-of-the-Art EPIC-IIBTM BiCMOS Design Significantly Reduces Power Dissipation
- Packaged in Plastic Shrink Small-Outline (DL) and Thin Shrink Small-Outline (DGG) Packages and 380-mil Fine-Pitch Ceramic Flat (WD) Packages SCOPE, Widebus, and EPIC-IIB are trademarks of Texas Instruments Incorporated.
产品概述
The 'ABT18640 scan test devices with 18-bit inverting bus
transceivers are members of the Texas Instruments SCOPETM
testability integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary scan to facilitate
testing of complex circuit-board assemblies. Scan access to the test
circuitry is accomplished via the 4-wire test access port (TAP)
interface.In the normal mode, these devices are 18-bit inverting bus
transceivers. They can be used either as two 9-bit transceivers or
one 18-bit transceiver. The test circuitry can be activated by the
TAP to take snapshot samples of the data appearing at the device pins
or to perform a self test on the boundary-test cells. Activating the
TAP in the normal mode does not affect the functional operation of
the SCOPETM bus transceivers.Data flow is controlled by the direction-control (DIR) and
output-enable () inputs. Data
transmission is allowed from the A bus to the B bus or from the B bus
to the A bus, depending on the logic level at DIR. can be used to disable the device
so that the buses are effectively isolated.In the test mode, the normal operation of the SCOPETM
bus transceivers is inhibited and the test circuitry is enabled to
observe and control the I/O boundary of the device. When enabled, the
test circuitry can perform boundary-scan test operations according to
the protocol described in IEEE Standard 1149.1-1990. Four dedicated test pins observe and control the operation of the
test circuitry: test data input (TDI), test data output (TDO), test
mode select (TMS), and test clock (TCK). Additionally, the test
circuitry performs other testing functions such as parallel-signature
analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are
synchronized to the TAP interface.The SN74ABT18640 is available in TI's shrink small-outline (DL)
and thin shrink small-outline (DGG) packages, which provide twice the
I/O pin count and functionality of standard small-outline packages in
the same printed-circuit-board area.The SN54ABT18640 is characterized for operation over the full
military temperature range of -55°C to 125°C. The
SN74ABT18640 is characterized for operation from -40°C to
85°C.
SN74ABT18640DL 数据手册
数据手册 | 说明 | 数量 | 操作 |
---|---|---|---|
![]() |
Scan Test Device with Inverting Bus Transceivers IC 56-SSOP |
30页,443K | 查看 |
SN74ABT18640DL 相关产品
- 74ACT1284MTCX
- 74LVC1GX04DCKTG4
- 74LVC1GX04GW,125
- 74SSTUB32868AZRHR
- 74SSTUB32868ZRHR
- 8V182512IDGGREP
- CD4007UBE
- CD4007UBEE4
- CD4007UBM96
- CD4007UBNSR
- CD4007UBPWR
- CD40117BE
- CD4089BE
- CD4089BEE4
- CD4089BNSR
- CD4089BPWR
- CD4527BE
- CD4527BNSR
- CD4527BPWR
- CD74AC283E
- CD74AC283M96
- CD74ACT283E
- CD74ACT283M
- CD74HC283E
- CD74HC283M
- CD74HC283M96
- CD74HCT283E
- CD74HCT283M96
- CLVC1GX04MDRLREP
- MC100E116FNR2G