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逻辑 - 专用逻辑热门型号
| 器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
|---|---|---|---|---|---|---|
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SN74ABT8543DWE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8543DWG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8543DWR | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8543DWRE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8543DWRG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8646DLG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8646DLRG4 | Texas Instruments | 28-BSSOP（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SSOP |
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SN74ABT8646DWG4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28SOIC |
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SN74ABT8646DWR | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74ABT8646DWRE4 | Texas Instruments | 28-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 28-SOIC |
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SN74LS294NE4 | Texas Instruments | 16-DIP（0.300"，7.62mm） |
IC PROG FREQ DIV/TIMER 16-DIP |
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SN74LS297NE4 | Texas Instruments | 16-DIP（0.300"，7.62mm） |
IC DIG PLL FILTER 16-DIP |
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SN74LS31DE4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC HEX DELAY ELEMENT 16-SOIC |
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SN74LS31DG4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC DELAY ELEMENT 16SOIC |
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SN74LS31DR | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC HEX DELAY ELEMENT 16-SOIC |
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SN74LS31DRE4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC HEX DELAY ELEMENT 16-SOIC |
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SN74LS31DRG4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC DELAY ELEMENT 16SOIC |
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SN74LS31NE4 | Texas Instruments | 16-DIP（0.300"，7.62mm） |
IC HEX DELAY ELEMENT 16-DIP |
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SN74LS31NSRG4 | Texas Instruments | 16-SOIC（0.209"，5.30mm |
IC DELAY ELEMENT HEX 16SOP |
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SN74LV161284DLG4 | Texas Instruments | 48-BSSOP（0.295"，7.50mm |
IC 19-BIT BUS INTERFACE 48-SSOP |