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型号	制造商	封装	描述
SN74S1051DG4	Texas Instruments	16-SOIC（0.154"，3.90mm	IC 12-BIT BUS TERM ARRAY16-SOIC
SN74S1051DRE4	Texas Instruments	16-SOIC（0.154"，3.90mm	IC 12-BIT BUS TERM ARRAY16-SOIC
NB4N527SMNR2	ON Semiconductor	16-VFQFN	IC DRVR/RCVR/BUFF/XLATOR 16-QFN
NB7VPQ16MMNTXG	ON Semiconductor	16-VFQFN	IC COPPER/CABLE DVR PROG 16-QFN
NB7VQ1006MMNG	ON Semiconductor	24-VFQFN	IC EQUALIZER RECEIVER 24-QFN
SN74ABT8543DWE4	Texas Instruments	28-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 28-SOIC
SN74ACT1284PWRE4	Texas Instruments	20-TSSOP（0.173"，4.40mm	IC 7BIT BUS INTERFC 3ST 20-TSSOP
SN74BCT29854DWR	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT8244ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24SOIC
SN74BCT8244ANTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE BUFF 24-DIP
SN74BCT8245ADW	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE TXRX 24-SOIC
SN74BCT8245ADWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE TXRX 24-SOIC
SN74BCT8245ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8245ANT	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE TXRX 24-DIP
SN74BCT8245ANTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE TXRX 24-DIP
SN74BCT8373ADWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE LATCH 24SOIC
SN74BCT8373ADWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8373ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8373ANTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE LATCH 24-DIP
SN74F283DRG4	Texas Instruments	16-SOIC（0.154"，3.90mm	IC BINARY FULL ADDER 16SOIC

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