搜索
发布采购
逻辑 - 专用逻辑热门型号
| 器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
|---|---|---|---|---|---|---|
 |
SN74BCT2414DWRG4 | Texas Instruments | 20-SOIC（0.295"，7.50mm |
IC MEMORY DECODER 20SOIC |
||
 |
SN74BCT2414NE4 | Texas Instruments | 20-DIP（0.300"，7.62mm） |
IC DECODER MEM DUAL 2-4 20-DIP |
||
 |
SN74BCT29854DWE4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC TRANSCEIVER 1-9BIT 24SOIC |
||
|
SN74BCT29854DWG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC TRANSCEIVER 1-9BIT 24SOIC |
||
 |
SN74BCT29854NTE4 | Texas Instruments | 24-DIP（0.300"，7.62mm） |
IC TRANSCEIVER 1-9BIT 24DIP |
||
|
SN74BCT8240ADWG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
||
|
SN74BCT8240ANTE4 | Texas Instruments | 24-DIP（0.300"，7.62mm） |
IC SCAN TEST DEVICE BUFF 24-DIP |
||
|
SN74BCT8244ADWRG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE BUFF 24SOIC |
||
|
SN74BCT8245ADWG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
||
|
SN74BCT8245ADWRG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
||
|
SN74BCT8373ADWG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
||
|
SN74BCT8374ADWG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
||
|
SN74F1016DWRE4 | Texas Instruments | 20-SOIC（0.295"，7.50mm |
IC ARRAY BUS-TERM 16BIT 20-SOIC |
||
 |
SN74F1056DRE4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC ARRAY BUS-TERM 8BIT 16-SOIC |
||
|
SN74F1056DRG4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC SCHOTTKY BARRIER DIODE 16SOIC |
||
|
SN74F283DE4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC FULL ADDER 4BIT BIN 16-SOIC |
||
|
SN74F283DG4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC BINARY FULL ADDER 16SOIC |
||
| MAX19005CCS+ | - | * |
IC DCL QUAD 300MHZ ATE 80TQFP |
|||
| MAX19005CCS+T | - | * |
IC DCL QUAD 300MHZ ATE 80TQFP |
|||
| MAX9967ADCCQ+TD | - | * |
IC DCL DUAL 500MBPS ATE 100TQFP |