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逻辑 - 专用逻辑热门型号
| 器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
|---|---|---|---|---|---|---|
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SN74BCT8244ADWRG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE BUFF 24SOIC |
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SN74BCT8244ANTE4 | Texas Instruments | 24-DIP（0.300"，7.62mm） |
IC SCAN TEST DEVICE BUFF 24-DIP |
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SN74BCT8245ADW | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE TXRX 24-SOIC |
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SN74BCT8245ADWRE4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE TXRX 24-SOIC |
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SN74BCT8245ADWRG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
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SN74BCT8245ANT | Texas Instruments | 24-DIP（0.300"，7.62mm） |
IC SCAN TEST DEVICE TXRX 24-DIP |
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SN74BCT8245ANTE4 | Texas Instruments | 24-DIP（0.300"，7.62mm） |
IC SCAN TEST DEVICE TXRX 24-DIP |
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SN74BCT8373ADWE4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE LATCH 24SOIC |
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SN74BCT8373ADWG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
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SN74BCT8373ADWRG4 | Texas Instruments | 24-SOIC（0.295"，7.50mm |
IC SCAN TEST DEVICE 24SOIC |
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SN74BCT8373ANTE4 | Texas Instruments | 24-DIP（0.300"，7.62mm） |
IC SCAN TEST DEVICE LATCH 24-DIP |
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SN74F283DRG4 | Texas Instruments | 16-SOIC（0.154"，3.90mm |
IC BINARY FULL ADDER 16SOIC |
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SN74TVC3306DCTRG4 | Texas Instruments | 7-LSSOP（0.11"?，2.80mm |
IC DUAL VOLTAGE CLAMP SM8 |
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SSTU32866EC,551 | NXP Semiconductors | 96-LFBGA |
IC BUFFER 1.8V 25BIT SOT536-1 |
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| SSTUA32864BHLFT | - | 96-LFBGA |
IC REGIST BUFFER 25BIT DDR 96BGA |
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SSTUA32864EC,518 | NXP Semiconductors | 96-LFBGA |
IC BUFFER 1.8V 25BIT SOT536 |
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SSTUA32864EC,557 | NXP Semiconductors | 96-LFBGA |
IC BUFFER 1.8V 25BIT SOT536 |
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SSTUA32866EC,518 | NXP Semiconductors | 96-LFBGA |
IC BUFFER 1.8V 25BIT SOT536 |
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SSTUA32866EC,557 | NXP Semiconductors | 96-LFBGA |
IC BUFFER 1.8V 25BIT SOT536 |
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| SSTUAF32868BHLFT | - | 176-TFBGA |
IC REG BUFFER 28BIT DDR2 176BGA |