逻辑 - 专用逻辑_逻辑 - 专用逻辑厂家_型号

逻辑 - 专用逻辑热门型号

型号	制造商	封装	描述
SN74BCT29854DWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854DWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854DWR	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854DWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854DWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC TRANSCEIVER 1-9BIT 24SOIC
SN74BCT29854NT	Texas Instruments	24-DIP（0.300"，7.62mm）	IC TRANSCEIVER 1-9BIT 24DIP
SN74BCT29854NTE4	Texas Instruments	24-DIP（0.300"，7.62mm）	IC TRANSCEIVER 1-9BIT 24DIP
SN74BCT8240ADWE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8240ADWG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8240ADWR	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE BUFF 24-SOIC
SN74BCT8240ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8374ADWR	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE W/FF 24-SOIC
SN74BCT8374ADWRE4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE W/FF 24-SOIC
SN74BCT8374ADWRG4	Texas Instruments	24-SOIC（0.295"，7.50mm	IC SCAN TEST DEVICE 24SOIC
SN74BCT8374ANT	Texas Instruments	24-DIP（0.300"，7.62mm）	IC SCAN TEST DEVICE W/FF 24-DIP
SN74F1016DWE4	Texas Instruments	20-SOIC（0.295"，7.50mm	IC ARRAY BUS-TERM 16BIT 20-SOIC
SN74F1016DWG4	Texas Instruments	20-SOIC（0.295"，7.50mm	IC SCHOTTKY BARRIER DIODE 20SOIC
SN74F1016DWRE4	Texas Instruments	20-SOIC（0.295"，7.50mm	IC ARRAY BUS-TERM 16BIT 20-SOIC
SN74F283NE4	Texas Instruments	16-DIP（0.300"，7.62mm）	IC FULL ADDER 4BIT BIN 16-DIP
SN74S1050DR	Texas Instruments	16-SOIC（0.154"，3.90mm	IC 12-BIT BUS TERM ARRAY16-SOIC

共 1462 条
<
1
60
61
62
63
64
65
74
>