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更新日期:2024-04-01 00:04:00

产品简介:低噪声精密高级 LinCMOS™ 双通道运算放大器

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TLC2202AMJGB 供应商

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TLC2202AMJGB 中文资料属性参数

  • 现有数量:0现货2,182Factory
  • 价格:在售
  • 系列:LinCMOS?
  • 包装:管件
  • 产品状态:在售
  • 放大器类型:CMOS
  • 电路数:2
  • 输出类型:满摆幅
  • 压摆率:2.7V/μs
  • 增益带宽积:1.9 MHz
  • -3db 带宽:-
  • 电流 - 输入偏置:1 pA
  • 电压 - 输入补偿:80 μV
  • 电流 - 供电:1.8mA(x2 通道)
  • 电流 - 输出/通道:50 mA
  • 电压 - 跨度(最小值):4.6 V
  • 电压 - 跨度(最大值):16 V
  • 工作温度:-55°C ~ 125°C(TA)
  • 安装类型:通孔
  • 封装/外壳:8-CDIP(0.300",7.62mm)
  • 供应商器件封装:8-CDIP

产品特性

  • B Grade Is 100% Tested for Noise 30 nV/Hz Max at f = 10 Hz 12 nV/Hz Max at f = 1 kHz
  • 30 nV/Hz Max at f = 10 Hz
  • 12 nV/Hz Max at f = 1 kHz
  • Low Input Offset Voltage . . . 500 µV Max
  • Excellent Offset Voltage Stability With Temperature . . . 0.5 µV/°C Typ
  • Rail-to-Rail Output Swing
  • Low Input Bias Current 1 pA Typ at TA = 25°C
  • 1 pA Typ at TA = 25°C
  • Common-Mode Input Voltage Range Includes the Negative Rail
  • Fully Specified For Both Single-Supply and Split-Supply Operation

产品概述

The TLC220x, TLC220xA, TLC220xB, and TLC220xY are precision, low-noise operational amplifiers using Texas Instruments Advanced LinCMOS™ process. These devices combine the noise performance of the lowest-noise JFET amplifiers with the dc precision available previously only in bipolar amplifiers. The Advanced LinCMOS™ process uses silicon-gate technology to obtain input offset voltage stability with temperature and time that far exceeds that obtainable using metal-gate technology. In addition, this technology makes possible input impedance levels that meet or exceed levels offered by top-gate JFET and expensive dielectric-isolated devices.The combination of excellent DC and noise performance with a common-mode input voltage range that includes the negative rail makes these devices an ideal choice for high-impedance, low-level signal-conditioning applications in either single-supply or split-supply configurations.The device inputs and outputs are designed to withstand –100-mA surge currents without sustaining latch-up. In addition, internal ESD-protection circuits prevent functional failures at voltages up to 2000 V as tested under MIL-PRF-38535, Method 3015.2; however, care should be exercised in handling these devices as exposure to ESD may result in degradation of the parametric performance.The C-suffix devices are characterized for operation from 0°C to 70°C. The I-suffix devices are characterized for operation from –40°C to 85°C. The M-suffix devices are characterized for operation over the full military temperature range of –55°C to 125°C.

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