更新日期:2024-04-01 00:04:00
产品简介:低噪声精密高级 LinCMOS™ 双通道运算放大器
查看详情TLC2202AMJGB 供应商
- 公司
- 型号
- 品牌
- 封装/批号
- 数量
- 地区
- 日期
- 说明
- 询价
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TI
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原厂原装
22+ -
3288
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上海市
-
-
-
一级代理原装
TLC2202AMJGB 中文资料属性参数
- 现有数量:0现货2,182Factory
- 价格:在售
- 系列:LinCMOS?
- 包装:管件
- 产品状态:在售
- 放大器类型:CMOS
- 电路数:2
- 输出类型:满摆幅
- 压摆率:2.7V/μs
- 增益带宽积:1.9 MHz
- -3db 带宽:-
- 电流 - 输入偏置:1 pA
- 电压 - 输入补偿:80 μV
- 电流 - 供电:1.8mA(x2 通道)
- 电流 - 输出/通道:50 mA
- 电压 - 跨度(最小值):4.6 V
- 电压 - 跨度(最大值):16 V
- 工作温度:-55°C ~ 125°C(TA)
- 安装类型:通孔
- 封装/外壳:8-CDIP(0.300",7.62mm)
- 供应商器件封装:8-CDIP
产品特性
- B Grade Is 100% Tested for Noise 30 nV/Hz Max at f = 10 Hz 12 nV/Hz Max at f = 1 kHz
- 30 nV/Hz Max at f = 10 Hz
- 12 nV/Hz Max at f = 1 kHz
- Low Input Offset Voltage . . . 500 µV Max
- Excellent Offset Voltage Stability With Temperature . . . 0.5 µV/°C Typ
- Rail-to-Rail Output Swing
- Low Input Bias Current 1 pA Typ at TA = 25°C
- 1 pA Typ at TA = 25°C
- Common-Mode Input Voltage Range Includes the Negative Rail
- Fully Specified For Both Single-Supply and Split-Supply Operation
产品概述
The TLC220x, TLC220xA, TLC220xB, and TLC220xY are precision, low-noise operational
amplifiers using Texas Instruments Advanced LinCMOS process. These devices combine the noise performance of the lowest-noise JFET amplifiers with the dc precision available previously only in bipolar amplifiers. The Advanced LinCMOS process uses silicon-gate technology to obtain input offset voltage stability with temperature and time that far exceeds that obtainable using metal-gate technology. In addition, this technology makes possible input impedance levels that meet or exceed levels offered by top-gate JFET and expensive dielectric-isolated devices.The combination of excellent DC and noise performance with a common-mode input voltage range that includes the negative rail makes these devices an ideal choice for high-impedance, low-level signal-conditioning applications in either single-supply or split-supply configurations.The device inputs and outputs are designed to withstand 100-mA surge currents without sustaining latch-up. In addition, internal ESD-protection circuits prevent functional failures at voltages up to 2000 V as tested under MIL-PRF-38535, Method 3015.2; however, care should be exercised in handling these devices as exposure to ESD may result in degradation of the parametric performance.The C-suffix devices are characterized for operation from 0°C to 70°C. The I-suffix devices are characterized for operation from 40°C to 85°C. The M-suffix devices are characterized for operation over the full military
temperature range of 55°C to 125°C.
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