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专用逻辑器件热门型号
| 器件图 | 型号 | 制造商 | 封装 | 描述 | 价格 | |
|---|---|---|---|---|---|---|
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SSTUA32S865ET/G;55 | - |
IC BUFFER 1.8V 28BIT SOT802 |
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SSTVA16859CKLFT/M | - |
IC REGISTER |
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SSTVF16857AGLFT/M | - |
IC REGISTER |
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SY100EL16VCZG-TR | - |
IC RCVR DIFF 5V/3.3V 8SOIC |
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SY100S314JY | - |
IC LINE RCVR QUINT DIFF 28-PLCC |
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5962-7604301VEA | Texas Instruments |
具有快速进位功能的 4 位二进制全加器 |
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5962-8976501EA | Texas Instruments |
具有快速进位的高速 CMOS 逻辑 4 位二进制全加器 |
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5962-9758701Q2A | Texas Instruments |
具有快速进位功能的 4 位二进制全加器 |
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HPA00023GKFR | - |
IC CLOCK BUFFER SSTL_2 114BGA |
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HPA00024GR | - |
IC CLOCK BUFFER SSTL_2 48TSSOP |
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HPA00032DGKER | - |
IC CLOCK BUFFER SSTL_18 96LFBGA |
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JM38510/07801BJA | Texas Instruments |
算术逻辑单元/函数发生器 |
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LM9740CCVS | - |
IC SGNL PROCESSOR 1CH 52MSPS |
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LM9780CCVS/NOPB | - |
NON-STANDARD PART CALL FIRST |
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NLSF457MU3TCG | - |
IC LOGIC GATE SGL 8UDFN |
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SN74BCT8240ANTG4 | - |
IC SCAN TEST DEVICE BUFF 24-DIP |
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SN74BCT8244ANTG4 | - |
IC SCAN TEST DEVICE BUFF 24-DIP |
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SN74BCT8245ANTG4 | - |
IC SCAN TEST DEVICE TXRX 24-DIP |
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SNJ54F283FK | Texas Instruments |
具有快速进位功能的 4 位二进制全加器 |
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SSTUA32S865ET/G,55 | - |
IC BUFFER 1.8V 28BIT SOT802 |